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Laboratories and Equipment

Microwave Characterization Laboratory (MiMiLab)

MiMi Laboratory
Microscopio stereoscopico ad alta precisione utilizzato per l’ispezione, il posizionamento e la caratterizzazione di dispositivi microelettronici.

The lab deals with both linear and power characterization of high-frequency devices circuits and systems. On-wafer testing facilities and an active load-pull system are available thus allowing also for model-extraction oriented characterization of high frequency devices. Finally, system-level measurements with arbitrary modulated signals are also available for the characterization of wireless communication circuits.

Keywords: Microwave Measurements, Load Pull Measurements, High Frequency Characterization, On wafer Measurements

 

RESEARCH TOPICS

  • DC characterization of hybrid and MMIC, active and passive devices and circuits
  • Linear characterization of hybrid passive circuits
  • Linear and non-linear characterization of hybrid active circuits
  • Linear and non-linear on wafer characterization of MMIC devices and circuits
  • Characterization oriented to active device model extraction

AVAILABLE SERVICES

  • DC, linear and non-linear on wafer device characterization up to 26 GHz.
  • Active and passive load and source -pull characterization up-to 20 GHz.
  • System level characterization up to 20 GHz.
  • Power amplifier characterization up to 40 GHz.

 

Contacts

Cluster and service laboratories